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Conference paper

Monitoring of local and global temperature non-uniformities by means of Therma-Prope metrology

In Monitoring of Local and Global Temperature Non-uniformities by Means of Therma-prope Metrology — 2009
From

Nanointegration Group, NanoSystemsEngineering Section, Department of Micro- and Nanotechnology, Technical University of Denmark1

NanoSystemsEngineering Section, Department of Micro- and Nanotechnology, Technical University of Denmark2

Department of Micro- and Nanotechnology, Technical University of Denmark3

Magnetic Systems Group, LabChip Section, Department of Micro- and Nanotechnology, Technical University of Denmark4

LabChip Section, Department of Micro- and Nanotechnology, Technical University of Denmark5

Silicon Microtechnology Group, MicroElectroMechanical Systems Section, Department of Micro- and Nanotechnology, Technical University of Denmark6

MicroElectroMechanical Systems Section, Department of Micro- and Nanotechnology, Technical University of Denmark7

Center for Nanoteknologi, Centers, Technical University of Denmark8

Center for Individual Nanoparticle Functionality, Centers, Technical University of Denmark9

Language: English
Year: 2009
Proceedings: Monitoring of local and global temperature non-uniformities by means of Therma-Prope metrology
Types: Conference paper
ORCIDs: Petersen, Dirch Hjorth and Hansen, Ole

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