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10 items by relevance
1 Journal article

Saturation of charge noise in Single Electron Tunneling transistor

Tavkhelidze, A.N.; Mygind, Jesper; Kuzmin, L.S.; Gorbonosov, O.

Czechoslovak Journal of Physics — 1996, Volume 46, Issue S4, pp. 2287-2288

Year: 1996

Language: English

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2 Journal article

Saturation of charge noise in Single Electron Tunneling transistor

Tavkhelidze, A. N.; Mygind, J.; Kuzmin, L. S.; Gorbonosov, O.

Czechoslovak Journal of Physics — 1996, Volume 46, Issue Suppl 4, pp. 2287-2288

Noise characteristics of Single Electron Tunneling (SET) transistors have been investigated at very low frequencies using resistive coaxial lines to prevent especially the high frequency part of the 4.2 K thermal radiation from reaching the sample. At 10 Hz we find a 1/f-type noise spectrum

Year: 1996

Language: English

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kgdmb cf alno peijh

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