Electron Microscopy Based Studies of Catalytically Grown Semiconductor Nanowires
(translated: Beam injection based nanocharacterization of advanced materials)
Publisher: | Research Signpost |
---|---|
Year: | 2008 |
Pages: | 1-35 |
ISBN: | 978-81-308-0226-8 |
DTU users get better search results including licensed content and discounts on order fees.
Anyone can log in and get personalized features such as favorites, tags and feeds.
(translated: Beam injection based nanocharacterization of advanced materials)
Publisher: | Research Signpost |
---|---|
Year: | 2008 |
Pages: | 1-35 |
ISBN: | 978-81-308-0226-8 |