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Journal article

Transmission electron microscopy investigation of Bi-2223/Ag tapes

By Andersen, L.G.; Bals, S.; Tendeloo, G. Van; Poulsen, H.F.1; Liu, Y.L.

From

Risø National Laboratory for Sustainable Energy, Technical University of Denmark1

The microstructure of (Bi,Pb)(2)Sr2Ca2CuOx (Bi-2223) tapes has been investigated by means of transmission electron microscopy (TEM) and high-resolution TEM. The emphasis has been placed on: (1) an examination of the grain morphology and size, (2) grain and colony boundary angles, which are formed during the tape processing, (3) a study of the grain boundaries on an atomic scale, including intergrowth investigations.

Tapes with different process parameters have been compared with respect to the microstructure. A fully processed tape has on the average 50% thicker Bi-2223 grains than a tape after the first annealing. The angles of c-axis tilt grain boundaries are on average 14 degrees and 26 degrees for the fully processed tape and the tape after the first annealing, respectively.

The intergrowth content(15%) and distribution are similar in these two tapes. (C) 2001 Elsevier Science B.V. All rights reserved.

Language: English
Year: 2001
Pages: 251-257
ISSN: 18732143 and 09214534
Types: Journal article
DOI: 10.1016/S0921-4534(00)01755-X
ORCIDs: Poulsen, H.F.
Keywords

Industrielle materialer

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