Journal article
Bulk lifetime determination in high purity silicon by contactless laser technique
The result of bulk lifetime measurements in high purity silicon are presented. For this investigation we offer a new method and technique for determination of the bulk value of the excess carrier lifetime in high purity silicon. The effective value of the lifetime being measured in such a material depends on the dimensions of the ingot.
In our method the sample to be investigated is illuminated by the modulated radiation of the AlGaAs light-emitting diode (LED), which generates the excess carriers, and by the probe beam of the He-Ne laser (λp = 3.39 μm), which becomes modulated when passing through the sample. The bulk lifetime is determined by the analysis of the dependence of the phase shift between these two modulations versus the distance r between the points on the sample surface illuminated by the sources.
Language: | English |
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Publisher: | Kluwer Academic Publishers |
Year: | 1997 |
Pages: | 213-216 |
ISSN: | 1573482x and 09574522 |
Types: | Journal article |
DOI: | 10.1023/A:1018558500090 |