About

Log in?

DTU users get better search results including licensed content and discounts on order fees.

Anyone can log in and get personalized features such as favorites, tags and feeds.

Log in as DTU user Log in as non-DTU user No thanks

DTU Findit

Interpreted as:

journal:(Analog AND Integrated AND Circuits AND and AND Signal AND Processing) AND title:(Reduced AND impact AND of AND induced AND gate AND noise AND on AND inductively AND degenerated AND LNAs AND in AND deep AND submicron AND CMOS AND technologies)

Suggestions: Include records that partially match the query

Filter results
Access
Type
Language
Year
From DTU
Advanced
1 Journal article

Reduced impact of induced gate noise on inductively degenerated LNAs in deep submicron CMOS technologies

that this is due to the effect of the parasitic overlap capacitances in the MOS device. In particular, we show that overlap capacitances lead to a significant induced-gate-noise reduction, especially when deep sub-micron CMOS processes are used.

Year: 2005

Language: English

bjil koanmepdgh cf
2 Journal article

Reduced Impact of Induced Gate Noise on Inductively Degenerated LNAs in Deep Submicron CMOS Technologies

that this is due to the effect of the parasitic overlap capacitances in the MOS device. In particular, we show that overlap capacitances lead to a significant induced-gate-noise reduction, especially when deep sub-micron CMOS processes are used.

Year: 2005

Language: English

ae hnl gokbdpjm ifc
3 Journal article

Reduced Impact of Induced Gate Noise on Inductively Degenerated LNAs in Deep Submicron CMOS Technologies

that this is due to the effect of the parasitic overlap capacitances in the MOS device. In particular, we show that overlap capacitances lead to a significant induced-gate-noise reduction, especially when deep sub-micron CMOS processes are used.

Year: 2004

Language: English

fb o in eghcalkdmjp

DTU users get better search results including licensed content and discounts on order fees.

Log in as DTU user