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Conference paper

Scan-plane truncation in diffraction tomography-based imaging

In Ieee Ap-s International Symposium — 2005, Volume 1B, pp. 187-189
From

Electromagnetic Systems, Department of Electrical Engineering, Technical University of Denmark1

Department of Electrical Engineering, Technical University of Denmark2

Three approaches for truncating the scan plane in diffraction tomography-based imaging are suggested and compared. The first and second approaches involve multiplication of a window to the scattered field before evaluating the spatial Fourier transform. The third method relies on an asymptotic end-point expansion of the Fourier integral.

Language: English
Publisher: IEEE
Year: 2005
Pages: 187-189
Proceedings: 2005 IEEE Antennas and Propagation Society International Symposium
ISBN: 0780388836 and 9780780388833
Types: Conference paper
DOI: 10.1109/APS.2005.1551517

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