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Interpreted as:

title:(The AND interface AND of AND directly AND bonded AND Si AND crystals AND studied AND by AND synchrotron AND X-ray AND diffraction)

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1 Conference paper

The interface of directly bonded Si crystals studied by synchrotron x-ray diffraction

Nielsen, M.; Feidenhans'l, R.; Howes, P.B.

Advanced Study Institutes Series, Asi-002 — 1998

Year: 1998

Language: English

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2 Conference paper

The interface of directly bonded Si crystals studied by synchrotron X-ray diffraction

Nielsen, M.; Poulsen, M.; Kumpf, C.; Feidenhans'l, R.; Howes, P.; Weichelt, S.; et al. (1 more)

Programme and Abstracts — 2000

Year: 2000

Language: English

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3 Conference paper

The interface of directly bonded Si crystals studied by synchrotron X-ray diffraction

Nielsen, M.; Poulsen, M.; Feidenhans'l, R.; Kumpf, C.; Grey, F.; Weichel, S.; et al. (2 more)

Programme and Abstracts — 2000

Year: 2000

Language: English

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4 Conference paper

The interface of directly-bonded Si crystals studied by synchrotron x-ray diffraction

Year: 1998

Language: English

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5 Conference paper

The interface of directly bonded Si crystals studied by synchrotron X-ray diffraction

Poulsen, M.; Nielsen, M.; Feidenhans'l, R.; Kumpf, C.; Grey, F.; Weichel, S.; et al. (2 more)

Programme. Abstracts. List of Participants — 2000

Year: 2000

Language: English

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6 Conference paper

The interface of directly-bonded Si crystals studied by synchrotron X-ray diffraction

Nielsen, M.; Feidenhans'l, R.; Howes, P.B.; Grey, F.; Rasmussen, K.; Vedde, J.

Invited and Contributed Papers — 2000, pp. 139-147

Year: 2000

Language: English

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7 Conference paper

The interface structure of directly bonded Si crystals studied by synchrotron X-ray diffraction

Year: 1999

Language: English

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