Journal article · Conference paper
Strain relaxation in thin films of Cu grown on Ni(001)
Surface X-ray diffraction and kinematical model calculations are used to determine the strain relaxation of embedded wedges with internal (111) facets formed in thin Cu films when grown on Ni(001). We show the wedges to be inhomogenously strained with a large lateral relaxation near the Cu/Ni interface which decays rapidly away from the interface. (C) 1998 Elsevier Science B.V.
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Language: | English |
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Year: | 1997 |
Pages: | 34-38 |
Proceedings: | 5th International Conference on Surface X-ray and Neutron Scattering |
ISSN: | 18732135 and 09214526 |
Types: | Journal article and Conference paper |
DOI: | 10.1016/S0921-4526(98)00199-9 |