Conference paper
Reducing artifacts from varying projection truncations
University of Copenhagen1
Department of Applied Mathematics and Computer Science, Technical University of Denmark2
Scientific Computing, Department of Applied Mathematics and Computer Science, Technical University of Denmark3
Ostbayerische Technische Hochschule Regensburg4
Technical University of Denmark5
We study samples with full and partial occlusion causing streak artifacts, and propose two modifications of filtered backprojection for artifact removal. Data is obtained by the SPring-8 synchrotron using a monochromatic parallel-beam scan [1]. Thresholding in the sinogram segments the metal, resulting in edges on which we apply 1) a smooth transition, or 2) a Dirichlet boundary condition.
| Language: | English |
|---|---|
| Year: | 2018 |
| Proceedings: | 3rd International Conference on Tomography of 3D Materials and Structures |
| Types: | Conference paper |
| ORCIDs: | 0000-0003-1261-6702 and Jørgensen, Jakob Sauer |
