Journal article ยท Conference paper
Near-field optical microscopy of localized excitations on rough surfaces: influence of a probe
Starting from the general principles of near-field optical microscopy. I consider the influence of a probe when being used to image localized dipolar excitations and suggest a way of evaluating the perturbation thus introduced. Using the rigorous microscopic (electric) point-dipole description, I calculate the self consistent field intensity at the site of a probe dipole scanning over resonantly interacting object dipoles and show that the intensity distribution deviates from that existing in the absence of a probe.
I demonstrate that this difference increases with an increase in the polarizability of the probe dipole, resulting eventually in a completely different intensity distribution, The calculations also show that the perturbation of the intensity distribution due to the presence of a probe decreases with an increase in the probe-sample distance.
In order to evaluate the degree of perturbation, I suggest comparing the images obtained at different probe-sample distances, Finally I formulate a simple rule of thumb that allows one to roughly estimate the probe-sample coupling when imaging localized elicitations.
Language: | English |
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Year: | 1999 |
Pages: | 561-566 |
Proceedings: | 5th International Conference on Near Field Optics and Related Techniques (NFO-5) |
ISSN: | 13652818 and 00222720 |
Types: | Journal article and Conference paper |
DOI: | 10.1046/j.1365-2818.1999.00501.x |