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Journal article
TOF-SIMS studies of yttria-stabilised zirconia 10.1002/sia.2314
Surface and Interface Analysis — 2006, Volume 38, Issue 5, pp. 911-916
The surface of an as-polished and an as-sintered yttria-stabilised zirconia pellet was analysed with XPS and TOF-SIMS (depth profiling and imaging) in order to study the distribution of impurities. The polished sample was slightly contaminated with Na, K, Mg and Ca. The sintered sample showed
Year: 2006
Language: English
