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Conference paper

The dynamic speckle-based wavemeter

In Proceedings of Spie 2018, Volume 10834, pp. 108342D-108342D-6
From

Department of Photonics Engineering, Technical University of Denmark1

Optical Sensor Technology, Department of Photonics Engineering, Technical University of Denmark2

DenseLight Semiconductor Pte. Ltd.3

Based on a previously devised speckle-based set-up for probing minute wavelength changes for a coherent field [1], [2] we will here present the first experiments where these changes are resolved on a millisecond time scale. The setup is based on probing the lateral shift of a speckle pattern arising from a slanted rough object, the speckle displacement being linearly proportional to the wavenumber change.

Thus, by shearing the speckle pattern across a grating-like structure [3],[4] and [5], a frequency proportional to the frequency of the wavelength change can be derived as will the irradiance. Thus, a cordial display of the complex field amplitude may be obtained with a high temporal resolution and a reasonable spectral resolution.

The spatial filter is here preliminarily implemented by recording the speckle pattern with a CMOS array with subsequent digital image processing mimicking the use of a spatial filter.

Language: English
Publisher: SPIE - International Society for Optical Engineering
Year: 2018
Pages: 108342D-108342D-6
Proceedings: 7th International Conference on Speckle Metrology
Series: Proceedings of Spie - the International Society for Optical Engineering
ISBN: 1510622977 , 1510622985 , 9781510622975 and 9781510622982
ISSN: 1996756x and 0277786x
Types: Conference paper
DOI: 10.1117/12.2319873
ORCIDs: Hanson, Steen Grüner and Jakobsen, Michael Linde

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