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Journal article · Conference paper

Large-scale Automated Analysis of High-Resolution Transmission Electron Microscopy Data Assisted by Deep Learning Neural Networks

By Leth Larsen, Matthew Helmi1,2; Nuñez Valencia, Cuauhtémoc1,2; Lomholdt, William Bang3,4,5; Kelly, Daniel3,4,5; Liu, Pei3,4,5; Wagner, Jakob Birkedal3,4; Winther, Ole6,7; Hansen, Thomas Willum3,4,5,8; Schiøtz, Jakob1,2

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Department of Physics, Technical University of Denmark1

Computational Atomic-scale Materials Design, Department of Physics, Technical University of Denmark2

National Centre for Nano Fabrication and Characterization, Technical University of Denmark3

Nanocharacterization, National Centre for Nano Fabrication and Characterization, Technical University of Denmark4

Atomic-scale Materials Dynamics, Nanocharacterization, National Centre for Nano Fabrication and Characterization, Technical University of Denmark5

Cognitive Systems, Department of Applied Mathematics and Computer Science, Technical University of Denmark6

Department of Applied Mathematics and Computer Science, Technical University of Denmark7

Center for Nanostructured Graphene, Centers, Technical University of Denmark8

Language: English
Publisher: Cambridge University Press
Year: 2022
Pages: 2984-2986
ISSN: 14358115 and 14319276
Types: Journal article and Conference paper
DOI: 10.1017/S1431927622011187
ORCIDs: Leth Larsen, Matthew Helmi , Nuñez Valencia, Cuauhtémoc , Lomholdt, William Bang , Kelly, Daniel , Liu, Pei , Wagner, Jakob Birkedal , Winther, Ole , Hansen, Thomas Willum and Schiøtz, Jakob

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