Journal article · Conference paper
Formation of Defects in MoS2 during Data Acquisition of High-resolution Transmission Electron Microscopy
Department of Physics, Technical University of Denmark1
Computational Atomic-scale Materials Design, Department of Physics, Technical University of Denmark2
National Centre for Nano Fabrication and Characterization, Technical University of Denmark3
Nanocharacterization, National Centre for Nano Fabrication and Characterization, Technical University of Denmark4
Atomic-scale Materials Dynamics, Nanocharacterization, National Centre for Nano Fabrication and Characterization, Technical University of Denmark5
Center for Nanostructured Graphene, Centers, Technical University of Denmark6
Language: | English |
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Publisher: | Cambridge University Press |
Year: | 2022 |
Pages: | 2192-2193 |
Proceedings: | Microscopy & Microanalysis 2022 |
ISSN: | 14358115 and 14319276 |
Types: | Journal article and Conference paper |
DOI: | 10.1017/S1431927622008467 |
ORCIDs: | Valencia, Cuauhtémoc Nuñez , Leth Larsen, Matthew Helmi , Lomholdt, William Bang , Kelly, Daniel , Schiøtz, Jakob and Hansen, Thomas Willum |