Journal article · Conference paper
Reconstructing the exit wave in high-resolution transmission electron microscopy using machine learning
Department of Physics, Technical University of Denmark1
Nanocharacterization, National Centre for Nano Fabrication and Characterization, Technical University of Denmark2
Center for Nanostructured Graphene, Centers, Technical University of Denmark3
National Centre for Nano Fabrication and Characterization, Technical University of Denmark4
Computational Atomic-scale Materials Design, Department of Physics, Technical University of Denmark5
Technical University of Denmark6
University of California at Berkeley7
Surface Physics and Catalysis, Department of Physics, Technical University of Denmark8
VISION – Center for Visualizing Catalytic Processes, Centers, Technical University of Denmark9
Department of Applied Mathematics and Computer Science, Technical University of Denmark10
Cognitive Systems, Department of Applied Mathematics and Computer Science, Technical University of Denmark11
Atomic-scale Materials Dynamics, Nanocharacterization, National Centre for Nano Fabrication and Characterization, Technical University of Denmark12
...and 2 moreHigh-resolution Transmission Electron Microscopy(HRTEM) has become a powerful technique for examining matter at the atomic-scale. In particular the ability to acquire single projection images of the sample volume in a parallel fashion while employing low electron doses and dose-rates makes HRTEM attractive to detect the atomic-scale realm of matter [1].
However, interpreting the image is not always straightforward, as the image is formed by phase contrast.
| Language: | English |
|---|---|
| Publisher: | Cambridge University Press |
| Year: | 2021 |
| Pages: | 254-256 |
| ISSN: | 14358115 and 14319276 |
| Types: | Journal article and Conference paper |
| DOI: | 10.1017/S1431927621001495 |
| ORCIDs: | Schiøtz, Jakob , Larsen, Matthew Helmi Leth , Helveg, Stig , Winther, Ole and Hansen, Thomas |
