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Journal article · Conference paper

Nickel Oxide Reduction Studied by Environmental TEM and in situ XRD

By Jeangros, Q.1; Hansen, Thomas Willum2; Wagner, Jakob Birkedal2; Damsgaard, Christian Danvad2; Dunin-Borkowski, R.E.3; Hébert, C.1; Van herle, J.1; Hessler-Wyser, A.1

From

Swiss Federal Institute of Technology Lausanne1

Center for Electron Nanoscopy, Technical University of Denmark2

Jülich Research Centre3

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Language: English
Publisher: Cambridge University Press
Year: 2012
Pages: 1176-1177
Proceedings: Microscopy and Microanalysis 2012 Meeting
ISSN: 14358115 and 14319276
Types: Journal article and Conference paper
DOI: 10.1017/S1431927612007738
ORCIDs: Hansen, Thomas Willum , Wagner, Jakob Birkedal and Damsgaard, Christian Danvad

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