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Interpreted as:
title:(The AND interface AND of AND directly-bonded AND Si AND crystals AND studied AND by AND synchrotron AND X-ray AND diffraction)
Suggestions: Include records that partially match the query
The interface of directly-bonded Si crystals studied by synchrotron x-ray diffraction
Year: 1998
Language: English
The interface of directly-bonded Si crystals studied by synchrotron X-ray diffraction
Invited and Contributed Papers — 2000, pp. 139-147
Year: 2000
Language: English
The interface of directly bonded Si crystals studied by synchrotron X-ray diffraction
Programme and Abstracts — 2000
Year: 2000
Language: English
The interface of directly bonded Si crystals studied by synchrotron X-ray diffraction
Programme and Abstracts — 2000
Year: 2000
Language: English
The interface of directly bonded Si crystals studied by synchrotron x-ray diffraction
Advanced Study Institutes Series, Asi-002 — 1998
Year: 1998
Language: English
The interface of directly bonded Si crystals studied by synchrotron X-ray diffraction
Programme. Abstracts. List of Participants — 2000
Year: 2000
Language: English
The interface structure of directly bonded Si crystals studied by synchrotron X-ray diffraction
Year: 1999
Language: English