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Journal article

Ni coarsening in Ni-yttria stabilized zirconia electrodes: Three-dimensional quantitative phase-field simulations supported by ex-situ ptychographic nano-tomography

From

Continuum Modelling and Testing, Department of Energy Conversion and Storage, Technical University of Denmark1

Department of Energy Conversion and Storage, Technical University of Denmark2

Central South University3

Imaging and Structural Analysis, Department of Energy Conversion and Storage, Technical University of Denmark4

In-depth understanding of nickel (Ni) coarsening is helpful for improving the service life of Ni-yttria stabilized zirconia (YSZ) electrodes in solid oxide cells. Unfortunately, very few quantitative experimental/theoretical descriptions of Ni coarsening in Ni-YSZ electrodes during long-term operation exist.

In this paper, quantitative modeling of Ni coarsening in Ni-YSZ electrodes was achieved through three-dimensional (3D) phase-field simulation supported by ex-situ ptychographic nano-tomography and input of reliable thermophysical parameters. A pragmatic procedure was proposed to refine and verify the materials parameters for the simulations.

Moreover, the microstructures of the Ni-YSZ electrode in the pristine and annealed states obtained via the ex-situ ptychographic nano-tomography were used as the initial input and experimental validation for the phase-field simulations. After that, comprehensive comparison between the simulated and the experimental 3D microstructures was conducted, indicating the successful quantitative phase-field simulation of Ni coarsening in Ni-YSZ electrodes presented here.

The success of this work is expected to pave the way for accurate prediction of the service life and even design of high-performance Ni-YSZ electrodes.

Language: English
Year: 2023
ISSN: 18732453 and 13596454
Types: Journal article
DOI: 10.1016/j.actamat.2023.118708
ORCIDs: Trini, Martina , De Angelis, Salvatore , Jørgensen, Peter Stanley , Bowen, Jacob R. , Chen, Ming , 0000-0001-8307-3712 , 0000-0002-8838-8681 and 0000-0002-5969-2406

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