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Conference paper

Observation of high-resolution diffraction profiles from single grains within polycrystalline metals

From

Risø National Laboratory for Sustainable Energy, Technical University of Denmark1

Language: English
Year: 2002
Proceedings: 51st Annual Denver X-Ray Conference
Types: Conference paper
ORCIDs: Fæster Nielsen, Søren , Pantleon, W. , Poulsen, H.F. and Schmidt, Søren
Keywords

5-I nano

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Analysis