Journal article
Direct characterization of ultraviolet-light-induced refractive index structures by scanning near-field optical microscopy
We have applied a reflection scanning near-field optical microscope to directly probe ultraviolet (UV)-light-induced refractive index structures in planar glass samples. This technique permits direct comparison between topography and refractive index changes (10(-5)-10(-3)) with submicrometer lateral resolution, The proposed method yields detailed information about the topography and index profiles of UV-written waveguides.
Language: | English |
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Publisher: | IEEE |
Year: | 1998 |
Pages: | 848-850 |
ISSN: | 19410174 and 10411135 |
Types: | Journal article |
DOI: | 10.1109/68.681506 |