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Conference paper

Structure of thin film TiO2 grown by magnetron sputtering analyzed by ion, electron, and X-ray scattering

By Janik, Katarzyna Agnieszka1; Seger, Brian2,3; B. Sillassen, M.4; Damsgaard, Christian Danvad1,2; Chorkendorff, Ib2,3; Wagner, Jakob Birkedal1

From

Center for Electron Nanoscopy, Technical University of Denmark1

Department of Physics, Technical University of Denmark2

Surface Physics and Catalysis, Department of Physics, Technical University of Denmark3

Aarhus University4

Language: English
Year: 2015
Proceedings: European Powder Diffraction Conference 2014
Types: Conference paper
ORCIDs: Seger, Brian , Damsgaard, Christian Danvad , Chorkendorff, Ib and Wagner, Jakob Birkedal
Keywords

Electron diffraction Grazing incidence X-ray diffraction Rutherford backscattering Titanium dioxide X-ray diffraction

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Analysis