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Conference paper

Unsupervised classification of x-ray mapping images of polished section

In Proceedings of Mva2000, Iapr Workshop on Machine Vision Applications — 2000, pp. 44-47
From

Department of Informatics and Mathematical Modeling, Technical University of Denmark1

Image Analysis and Computer Graphics, Department of Informatics and Mathematical Modeling, Technical University of Denmark2

Language: English
Year: 2000
Pages: 44-47
Proceedings: Proceedings of MVA2000, IAPR Workshop on Machine Vision Applications
Types: Conference paper
ORCIDs: Nielsen, Allan Aasbjerg and Carstensen, Jens Michael

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Analysis