Journal article
Influence of charged oxide layers on TEM imaging of reverse-biasedp−njunctions
Language: | English |
---|---|
Year: | 2003 |
ISSN: | 10953795 and 01631829 |
Types: | Journal article |
DOI: | 10.1103/PhysRevB.67.045328 |
DTU users get better search results including licensed content and discounts on order fees.
Anyone can log in and get personalized features such as favorites, tags and feeds.
Journal article
Language: | English |
---|---|
Year: | 2003 |
ISSN: | 10953795 and 01631829 |
Types: | Journal article |
DOI: | 10.1103/PhysRevB.67.045328 |
Analysis