Journal article
Characterization of voids in shock-loaded Al single crystal by combining X-ray tomography and electron microscopy
Department of Wind Energy, Technical University of Denmark1
Materials science and characterization, Department of Wind Energy, Technical University of Denmark2
Composites Mechanics and Materials Mechanics, Department of Wind Energy, Technical University of Denmark3
Oak Ridge National Laboratory4
Villum Center for Advanced Structural and Material Testing, Centers, Technical University of Denmark5
A combination of X-ray tomography and electron backscatter diffraction (EBSD) was applied to investigate both the shape of voids and the plastic deformation around voids in an Al single crystal shock-loaded in the direction. The combination of these two techniques allows the addition of crystallographic information to X-ray tomography and allows the addition of three-dimensional information to EBSD data.
It is found that the voids are octahedral with {1 1 1} faces and that regular patterns of lattice reorientation exist around individual voids. The results provide new insights to the process of void growth during shock loading, which is important for both civil and military applications.
| Language: | English |
|---|---|
| Year: | 2017 |
| Pages: | 012027 |
| ISSN: | 1757899x and 17578981 |
| Types: | Journal article |
| DOI: | 10.1088/1757-899X/219/1/012027 |
| ORCIDs: | Hong, Chuanshi , Fæster, Søren and Huang, Xiaoxu |
