Conference paper
Uncertainty Estimation in SiGe HBT Small-Signal Modeling
An uncertainty estimation and sensitivity analysis is performed on multi-step de-embedding for SiGe HBT small-signal modeling. The uncertainty estimation in combination with uncertainty model for deviation in measured S-parameters, quantifies the possible error value in de-embedded two-port parameters (Y and Z - parameters).
The analysis is applied to a 0.35 μm 60 GHz fT SiGe HBT in frequency range 45 MHz to 26 GHz.
| Language: | English |
|---|---|
| Publisher: | IEEE |
| Year: | 2005 |
| Pages: | 393-396 |
| Proceedings: | European Gallium Arsenide and Other Semiconductor Application Symposium |
| ISBN: | 8890201207 and 9788890201202 |
| Types: | Conference paper |
| ORCIDs: | Johansen, Tom Keinicke |
45 MHz to 26 GHz 60 GHz Data mining Frequency Ge-Si alloys Germanium silicon alloys HBT small-signal modeling Heterojunction bipolar transistors Integrated circuit interconnections S-parameter measurement S-parameters Scattering parameters Sensitivity analysis SiGe Silicon germanium Stochastic processes UHF bipolar transistors Uncertainty VHF devices heterojunction bipolar transistors microwave bipolar transistors millimetre wave bipolar transistors multistep deembedding semiconductor device models semiconductor materials sensitivity analysis two-port networks two-port parameters uncertainty estimation
