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10 items by relevance
1 Journal article

Atomic spectrometry update. X-Ray fluorescence spectrometry

West, Margaret; Ellis, Andrew T.; Potts, Philip J.; Streli, Christina; Vanhoof, Christine; Wegrzynek, Dariusz; et al. (1 more)

Journal of Analytical Atomic Spectrometry — 2009, Volume 24, Issue 10, pp. 1289-1326

Year: 2009

Language: Undetermined

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2 Journal article

Atomic spectrometry update. X-ray fluorescence spectrometry

Potts, Philip J.; Ellis, Andrew T.; Kregsamer, Peter; Marshall, John; Streli, Christina; West, Margaret; et al. (1 more)

Journal of Analytical Atomic Spectrometry — 2002, Volume 17, Issue 10, pp. 1439-1455

This annual review of X-ray fluorescence covers developments over the period 2001–2002 in instrumentation and detectors, matrix correction and spectrum analysis software, X-ray optics and microfluorescence, synchrotron XRF, TXRF and portable XRF as assessed from the published literature. The review

Year: 2002

Language: Undetermined

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3 Journal article

Atomic spectrometry update. X-ray fluorescence spectrometry

Potts, Philip J.; Ellis, Andrew T.; Kregsamer, Peter; Marshall, John; Streli, Christina; West, Margaret; et al. (1 more)

Journal of Analytical Atomic Spectrometry — 2003, Volume 18, Issue 10, pp. 1297-1316

Year: 2003

Language: Undetermined

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pjagnfkm l oedbich
4 Journal article

Atomic spectrometry update. X-ray fluorescence spectrometry

West, Margaret; Ellis, Andrew T.; Kregsamer, Peter; Potts, Philip J.; Streli, Christina; Vanhoof, Christine; et al. (1 more)

Journal of Analytical Atomic Spectrometry — 2007, Volume 22, Issue 10, pp. 1304-1332

This annual review of X-ray fluorescence covers developments over the period 2006–2007 in instrumentation and detectors, matrix correction and spectrum analysis procedures, X-ray optics and micro-fluorescence, synchrotron XRF, TXRF, portable XRF and on-line applications as assessed from

Year: 2007

Language: Undetermined

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5 Journal article

Atomic Spectrometry Update. X-ray fluorescence spectrometry

Potts, Philip J.; Ellis, Andrew T.; Kregsamer, Peter; Marshall, John; Streli, Christina; West, Margaret; et al. (1 more)

Journal of Analytical Atomic Spectrometry — 2001, Volume 16, Issue 10, pp. 1217-1237

This annual review of X-ray fluorescence covers developments over the period 2000–2001 in instrumentation and detectors, matrix correction and spectrum analysis software, X-ray optics and microfluorescence, synchrotron XRF, TXRF, portable XRF and on-line applications as assessed from the published

Year: 2001

Language: Undetermined

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6 Journal article

Atomic spectrometry update. X-Ray fluorescence spectrometry

Potts, Philip J.; Ellis, Andrew T.; Kregsamer, Peter; Streli, Christina; Vanhoof, Christine; West, Margaret; et al. (1 more)

Journal of Analytical Atomic Spectrometry — 2005, Volume 20, Issue 10, pp. 1124-1154

This annual review of X-ray fluorescence covers developments over the period 2004–2005 in instrumentation and detectors, matrix correction and spectrum analysis procedures, X-ray optics and microfluorescence, synchrotron XRF, TXRF, portable XRF and on-line applications, as assessed from

Year: 2005

Language: Undetermined

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7 Journal article

Atomic Spectrometry Update—Atomic Mass Spectrometry and X-Ray Fluorescence Spectrometry

Bacon, Jeffrey R.; Ellis, Andrew T.; McMahon, Adam W.; Potts, Philip J.; Williams, John G.

Journal of Analytical Atomic Spectrometry — 1994, Volume 9, Issue 10, pp. 267R-305R

Strong developments continue in most areas of atomic spectrometry and this review year has seen the introduction of new instrumentation and methodologies, refinements and improvements of established procedures and applications to new fields of study. The large number of papers published on ICP-MS

Year: 1994

Language: Undetermined

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8 Journal article

Atomic Spectrometry Update—Atomic Mass Spectrometry and X-Ray Fluorescence Spectrometry

Bacon, Jeffrey R.; Chenery, Simon R. N.; Ellis, Andrew T.; Fisher, Andrew; McMahon, Adam W.; Potts, Philip J.; et al. (1 more)

Journal of Analytical Atomic Spectrometry — 1995, Volume 10, Issue 10, pp. 253R-309R

The large number of papers covered in this year's review emphasizes the strong developments which continue in atomic mass and X-ray fluorescence spectrometries. Although much of the effort is aimed at improving existing technology and methodology, new and innovative instrumentation is also being

Year: 1995

Language: Undetermined

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9 Journal article

Atomic Spectrometry Update—Atomic Mass Spectrometry and X-Ray Fluorescence Spectrometry

Bacon, Jeffrey R.; Ellis, Andrew T.; McMahon, Adam W.; Potts, Philip J.; Williams, John G.

Journal of Analytical Atomic Spectrometry — 1993, Volume 8, Issue 7, pp. 261R-310R

Strong development continues in most areas of atomic mass spectrometry. There is an ever increasing pressure to push back limits with the result that reported performances in terms of absolute detection limits, sample requirement and isotopic abundance sensitivities are reaching levels that could

Year: 1993

Language: Undetermined

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10 Journal article

Atomic Spectrometry Update—Atomic Mass Spectrometry and X-ray Fluorescence Spectrometry

Bacon, Jeffrey R.; Ellis, Andrew T.; McMahon, Adam W.; Potts, Philip J.; Williams, John G.

Journal of Analytical Atomic Spectrometry — 1992, Volume 7, Issue 7, pp. 279R-327R

measurements has contributed to a high level of activity in SRXRF. In particular, the development of SRXRF microprobes has generated strong growth in the increasingly important area of X-ray microfluorescence (XRMF). In contrast to the use of rather specialized and centralized SR sources for XRMF

Year: 1992

Language: Undetermined

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