Journal article
The location of Ti containing phases after the completion of the NaAlH4+xTiCl3 milling process
Physics Department, Institute for Energy Technology, P.O. Box 40 Kjeller, N-2027, Norway1
Department of Physics, Norwegian University of Science and Technology, N-7491 Trondheim, Norway2
Department of Imaging and Applied Physics, Curtin University, GPO Box U1987, Perth 6845, Western Australia, Australia3
Department of Chemistry, University of Hawaii, Honolulu, HI 96822, USA4
Swiss-Norwegian Beam Line, European Synchrotron Radiation Facility, BP 220, Grenoble, CEDEX, France5
The NaAlH4+xTiCl3 (x<0.1) system has been studied by X-ray synchrotron diffraction and transmission electron microscopy (TEM) after the completion of the milling process, for both planetary (PM) and cryo milled (CM) samples. Comparison of the NaAlH4 mosaic size (coherence length) determined from the X-ray synchrotron diffraction lineshape, and measurement of the external powder grain dimensions of ca. 250–300 particles by TEM, reveals that after the completion of the milling process, 〈110〉 {111} edge dislocated 2–20nm Al crystallites are dispersed in a Ti rich amorphous (a-)Al1−xTix (0.3
This nano Al/Al50Ti50 composite is embedded on the surface of single crystalline NaAlH4 powder grains. The NaAlH4 single crystal powder grains are moderately defected with uncorrelated defects, induced from the milling process.
| Language: | English |
|---|---|
| Year: | 2012 |
| Pages: | 597-605 |
| ISSN: | 18734669 and 09258388 |
| Types: | Journal article |
| DOI: | 10.1016/j.jallcom.2011.11.021 |
