Journal article
Robust mapping of electrical properties of graphene from terahertz time-domain spectroscopy with timing jitter correction
Department of Micro- and Nanotechnology, Technical University of Denmark1
Nanocarbon, Department of Micro- and Nanotechnology, Technical University of Denmark2
Department of Photonics Engineering, Technical University of Denmark3
Ultrafast Infrared and Terahertz Science, Department of Photonics Engineering, Technical University of Denmark4
University of Cambridge5
Center for Nanostructured Graphene, Centers, Technical University of Denmark6
We demonstrate a method for reliably determining the electrical properties of graphene including the carrier scattering time and carrier drift mobility from terahertz timedomain spectroscopy measurements (THz-TDS). By comparing transients originating from directly transmitted pulses and the echoes from internal reflections in a substrate, we are able to extract electrical properties irrespective of random time delays between pulses emitted in a THz-TDS setup.
If such time delays are not accounted for they can significantly influence the extracted properties of the material. The technique is useful for a robust determination of electrical properties from THz-TDS measurements and is compatible with substrate materials where transients from internal reflections are well-separated in time.
Language: | English |
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Year: | 2017 |
Pages: | 2725-2732 |
ISSN: | 10944087 |
Types: | Journal article |
DOI: | 10.1364/OE.25.002725 |
ORCIDs: | Whelan, Patrick Rebsdorf , Bøggild, Peter and Jepsen, Peter Uhd |