Journal article
Catastrophic optical mirror damage in diode lasers monitored during single-pulse operation
Optical Sensor Technology, Department of Photonics Engineering, Technical University of Denmark1
Department of Photonics Engineering, Technical University of Denmark2
Diode Lasers and LED Systems, Department of Photonics Engineering, Technical University of Denmark3
Teraherts Technologies and Biophotonics, Department of Photonics Engineering, Technical University of Denmark4
Catastrophic optical mirror damage (COMD) is analyzed for 808 nm emitting diode lasers in single-pulse operation in order to separate facet degradation from subsequent degradation processes. During each pulse, nearfield and thermal images are monitored. A temporal resolution better than 7 µs is achieved.
The thermal runaway process is unambiguously related to the occurrence of a “thermal flash.” A one-by-one correlation between nearfield, thermal flash, thermal runaway, and structural damage is observed. The single-pulse excitation technique allows for controlling the propagation of the structural damage into the cavity.
We propose this technique for the analysis of early stages of COMD.
| Language: | English |
|---|---|
| Publisher: | American Institute of Physics |
| Year: | 2009 |
| ISSN: | 10773118 and 00036951 |
| Types: | Journal article |
| DOI: | 10.1063/1.3133339 |
| ORCIDs: | Larsen, Henning Engelbrecht , Petersen, Paul Michael and Andersen, Peter E. |
