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Journal article · Preprint article

Anisotropy enhanced X-ray scattering from solvated transition metal complexes

From

Department of Physics, Technical University of Denmark1

Neutrons and X-rays for Materials Physics, Department of Physics, Technical University of Denmark2

Department of Chemistry, Technical University of Denmark3

University of Iceland4

Technical University of Denmark5

SLAC National Accelerator Laboratory6

Time-resolved X-ray scattering patterns from photoexcited molecules in solution are in many cases anisotropic at the ultrafast time scales accessible at X-ray free-electron lasers (XFELs). This anisotropy arises from the interaction of a linearly polarized UV-Vis pump laser pulse with the sample, which induces anisotropic structural changes that can be captured by femtosecond X-ray pulses.

In this work, a method for quantitative analysis of the anisotropic scattering signal arising from an ensemble of molecules is described, and it is demonstrated how its use can enhance the structural sensitivity of the time-resolved X-ray scattering experiment. This method is applied on time-resolved X-ray scattering patterns measured upon photoexcitation of a solvated di-platinum complex at an XFEL, and the key parameters involved are explored.

It is shown that a combined analysis of the anisotropic and isotropic difference scattering signals in this experiment allows a more precise determination of the main photoinduced structural change in the solute, i.e. the change in Pt-Pt bond length, and yields more information on the excitation channels than the analysis of the isotropic scattering only.

Finally, it is discussed how the anisotropic transient response of the solvent can enable the determination of key experimental parameters such as the instrument response function.

Language: English
Year: 2018
Pages: 306-315
ISSN: 16005775 and 09090495
Types: Journal article and Preprint article
DOI: 10.1107/S1600577517016964
ORCIDs: Biasin, Elisa , Vester, Peter , Kjaer, Kasper S. , Henriksen, Niels E. , Møller, Klaus B. , Haldrup, Kristoffer and Nielsen, Martin M.

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