Journal article
Fast and direct measurements of the electrical properties of graphene using micro four-point probes
Department of Micro- and Nanotechnology, Technical University of Denmark1
Solar Energy Programme, Risø National Laboratory for Sustainable Energy, Technical University of Denmark2
Risø National Laboratory for Sustainable Energy, Technical University of Denmark3
Technical University of Denmark4
CAPRES A/S5
We present measurements of the electronic properties of graphene using a repositionable micro four-point probe system, which we show here to have unique advantages over measurements made on lithographically defined devices; namely speed, simplicity and lack of a need to pattern graphene. Measurements are performed in ambient, vacuum and controlled environmental conditions using an environmental scanning electron microscope (SEM).
The results are comparable to previous results for microcleaved graphene on silicon dioxide (SiO2). We observe a pronounced hysteresis of the charge neutrality point, dependent on the sweep rate of the gate voltage; and environmental measurements provide insight into the sensor application prospects of graphene.
The method offers a fast, local and non-destructive technique for electronic measurements on graphene, which can be positioned freely on a graphene flake.
Language: | English |
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Publisher: | IOP Publishing |
Year: | 2011 |
Pages: | 445702 |
ISSN: | 13616528 and 09574484 |
Types: | Journal article |
DOI: | 10.1088/0957-4484/22/44/445702 |
ORCIDs: | Petersen, Dirch Hjorth , Booth, Tim and Bøggild, Peter |