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Journal article

Singular value decomposition as a tool for background corrections in time-resolved XFEL scattering data

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Department of Physics, Technical University of Denmark1

Neutrons and X-rays for Materials Physics, Department of Physics, Technical University of Denmark2

The development of new X-ray light sources, XFELs, with unprecedented time and brilliance characteristics has led to the availability of very large datasets with high time resolution and superior signal strength. The chaotic nature of the emission processes in such sources as well as entirely novel detector demands has also led to significant challenges in terms of data analysis.

This paper describes a heuristic approach to datasets where spurious background contributions of a magnitude similar to (or larger) than the signal of interest prevents conventional analysis approaches. The method relies on singular-value decomposition of no-signal subsets of acquired datasets in combination with model inputs and appears generally applicable to time-resolved X-ray diffuse scattering experiments.

Language: English
Publisher: The Royal Society
Year: 2014
Pages: 20130336
ISSN: 14712970 and 09628436
Types: Journal article
DOI: 10.1098/rstb.2013.0336
ORCIDs: Haldrup, Kristoffer

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