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Preprint article · Journal article

A Deep Learning Approach to Identify Local Structures in Atomic-Resolution Transmission Electron Microscopy Images

From

Department of Physics, Technical University of Denmark1

Center for Atomic-scale Materials Design, Centers, Technical University of Denmark2

Center for Electron Nanoscopy, Technical University of Denmark3

Department of Applied Mathematics and Computer Science, Technical University of Denmark4

Cognitive Systems, Department of Applied Mathematics and Computer Science, Technical University of Denmark5

Recording atomic-resolution transmission electron microscopy (TEM) images isbecoming increasingly routine. A new bottleneck is then analyzing thisinformation, which often involves time-consuming manual structuralidentification. We have developed a deep learning-based algorithm forrecognition of the local structure in TEM images, which is stable to microscopeparameters and noise.

The neural network is trained entirely from simulationbut is capable of making reliable predictions on experimental images. We applythe method to single sheets of defected graphene, and to metallic nanoparticleson an oxide support.

Language: English
Year: 2018
Pages: 1800037
ISSN: 25130390
Types: Preprint article and Journal article
DOI: 10.1002/adts.201800037
ORCIDs: Liu, Pei , Kling, Jens , Wagner, Jakob Birkedal , Hansen, Thomas Willum , Winther, Ole and Schiøtz, Jakob

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