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Journal article

Theory and practice of the FFT/matrix inversion technique for probe-corrected spherical near-field antenna measurements with high-order probes

From

Aalto University1

Electromagnetic Systems, Department of Electrical Engineering, Technical University of Denmark2

Department of Electrical Engineering, Technical University of Denmark3

A complete antenna pattern characterization procedure for spherical near-field antenna measurements employing a high-order probe and a full probe correction is described. The procedure allows an (almost) arbitrary antenna to be used as a probe. Different measurement steps of the procedure and the associated data processing are described in detail, and comparison to the existing procedure employing a first-order probe is made.

The procedure is validated through measurements.

Language: English
Publisher: IEEE
Year: 2010
Pages: 2623-2631
ISSN: 15582221 and 0018926x
Types: Journal article
DOI: 10.1109/TAP.2010.2050437
ORCIDs: Breinbjerg, Olav

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