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Journal article

Correction to: Accuracy of surface strain measurements from transmission electron microscopy images of nanoparticles

By Madsen, Jacob1,2; Liu, Pei3; Wagner, Jakob Birkedal3; Hansen, Thomas W.3; Schiøtz, Jakob1,2

From

Department of Physics, Technical University of Denmark1

Computational Atomic-scale Materials Design, Department of Physics, Technical University of Denmark2

Center for Electron Nanoscopy, Technical University of Denmark3

Unfortunately, after publication of this article [1], it was noticed that the name of the fifth author was incorrectly displayed as Jakob Schiøz. The correct name is Jakob Schiøtz and can be seen in the corrected author list above. The original article has also been updated to correct this error.

Language: English
Publisher: Springer International Publishing
Year: 2017
Pages: 1-12
ISSN: 21980926
Types: Journal article
DOI: 10.1186/s40679-017-0049-y
ORCIDs: Liu, Pei , Wagner, Jakob Birkedal , Hansen, Thomas W. , Schiøtz, Jakob and 0000-0001-5534-0553
Keywords

High-resolution transmission electron microscopy Nanoparticles Strain mapping Surface strain

Other keywords

Biological Microscopy Characterization and Evaluation of Materials Materials Science SC5 Spectroscopy/Spectrometry

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