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Journal article

Exploring the environmental transmission electron microscope

In Micron 2012, Volume 43, Issue 11, pp. 1169-1175
From

Center for Electron Nanoscopy, Technical University of Denmark1

Department of Physics, Technical University of Denmark2

Surface Physics and Catalysis, Department of Physics, Technical University of Denmark3

The increasing interest and development in the field of in situ techniques have now reached a level where the idea of performing measurements under near realistic conditions has become feasible for transmission electron microscopy (TEM) while maintaining high spatial resolution.In this paper, some of the opportunities that the environmental TEM (ETEM) offers when combined with other in situ techniques will be explored, directly in the microscope, by combining electron-based and photon-based techniques and phenomena.

In addition, application of adjacent setups using sophisticated transfer methods for transferring the specimen between specialized in situ equipment without compromising the concept of in situ measurements will be exploited. The opportunities and techniques are illustrated by studies of materials systems of Au/MgO and Cu2O in different gaseous environments.

Language: English
Year: 2012
Pages: 1169-1175
ISSN: 18784291 and 09684328
Types: Journal article
DOI: 10.1016/j.micron.2012.02.008
ORCIDs: Wagner, Jakob B. , Damsgaard, Christian D. , Duchstein, Linus D.L. and Hansen, Thomas W.

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