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Conference paper · Journal article

Topographic changes in Ni-5at.%W substrate after annealing under conditions of buffer layer crystallization

In Physics Procedia 2012, Volume 36, pp. 497-502
From

Department of Energy Conversion and Storage, Technical University of Denmark1

Electrofunctional materials, Department of Energy Conversion and Storage, Technical University of Denmark2

Department of Wind Energy, Technical University of Denmark3

Materials science and characterization, Department of Wind Energy, Technical University of Denmark4

Topographic changes have been studied in an annealed Ni-5at.%W substrate with a strong cube texture before and after additional annealing reproducing conditions of buffer layer crystallization. It was found that during this additional annealing the microstructure slightly coarsened and that the average depth of grain boundary grooves increased considerably for certain boundary types.

Grooves at general high angle boundaries and Σ3 boundaries with large deviations from the ideal twin relationship were found to be more sensitive to the additional heat-treatment than grooves at low angle and true twin boundaries. Average groove widths increased for all boundary types. Despite the observed changes in the extent of grain boundary grooving, the mean surface roughness was almost identical before and after the additional annealing. © 2012 Published by Elsevier B.V.

Selection and/or peer-review under responsibility of the Guest Editors.

Language: English
Year: 2012
Pages: 497-502
Proceedings: Superconductivity Centennial Conference (SCC-2011)
ISSN: 18753884 and 18753892
Types: Conference paper and Journal article
DOI: 10.1016/j.phpro.2012.06.147
ORCIDs: Wulff, Anders Christian , Mishin, Oleg and Grivel, Jean-Claude

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