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Conference paper · Journal article

Boundary migration during recrystallization of heavily deformed pure nickel

By Zhang, Yubin1,2; Juul Jensen, Dorte1,2; Godfrey, Andrew3

From

Department of Wind Energy, Technical University of Denmark1

Materials science and characterization, Department of Wind Energy, Technical University of Denmark2

Tsinghua University3

The detailed microstructure in front of recrystallization boundaries and their migration during annealing were traced using ex-situ electron backscatter pattern maps of one and the same surface area taken after annealing. It is observed that many protrusions/detrusions form on the recrystallizing boundaries.

During annealing, the recrystallization boundary segments migrate in a stop-go type of fashion, while protrusions and detrusions alternately form and disappear. The correlation between the protrusions/detrusions and the stop-go type of migration are briefly discussed.

Language: English
Publisher: Trans Tech Publications Ltd
Year: 2012
Pages: 329-332
Proceedings: 4th International Conference on Recrystallization and Grain GrowthInternational Conference on Recrystallization and Grain Growth
ISSN: 22976620 , 14226375 , 02555476 and 16629752
Types: Conference paper and Journal article
DOI: 10.4028/www.scientific.net/MSF.715-716.329
ORCIDs: Zhang, Yubin and Juul Jensen, Dorte
Keywords

Boundary migration Electron backscattered pattern (EBSP) Nickel Protrusions

Other keywords

Boundary Migration Electron Backscattered Pattern (EBSP)

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