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Journal article

A novel method for quantitative height measurement based on an astigmatic optical profilometer

From

National Taiwan University1

Department of Micro- and Nanotechnology, Technical University of Denmark2

Nanoprobes, Department of Micro- and Nanotechnology, Technical University of Denmark3

Center for Intelligent Drug Delivery and Sensing Using Microcontainers and Nanomechanics, Department of Health Technology, Technical University of Denmark4

Astigmatic detection systems have been used in hybrid systems to produce both contact and noncontact profilometers, which provide advantageous features such as low cost, small laser spot, high bandwidth, and compact size. However, current astigmatic optical profilometers cannot provide quantitative height measurement on a surface consisting of complex materials.

In this paper, a novel method called z-axis modulation is proposed to overcome this limitation. A homemade astigmatic optical profilometer was developed, and an analytical process for height calculation was also developed. As demonstrated by the experimental results, z-axis modulation can provide accurate height measurement.

Furthermore, optical properties such as reflectivity can also be measured.

Language: English
Year: 2018
Pages: 107002
ISSN: 13616501 and 09570233
Types: Journal article
DOI: 10.1088/1361-6501/aadc49
ORCIDs: 0000-0003-1338-0332 and Hwu, En Te

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