Journal article
Reliable Operation for 14500 h of a Wavelength-Stabilized Diode Laser System on a Microoptical Bench at 671 nm
Reliability tests for wavelength-stabilized compact diode laser systems emitting at 671 nm are presented. The devices were mounted on microoptical benches with the dimensions of 13 mm $\times\,$4 mm. Reflecting Bragg gratings were used for wavelength stabilization and emission width narrowing. The reliability tests were performed at 25$^{\circ}{\rm C}$ and at an output power up to 10 mW per micrometer stripe width of the gain medium.
Reliable operation could be demonstrated over a test time up to 14500 h at an output power up to 1.0 W. Environmental tests using random vibrations with acceleration up to 29 g were performed without deterioration of the devices.
Language: | English |
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Publisher: | IEEE |
Year: | 2012 |
Pages: | 116-121 |
ISSN: | 21563985 and 21563950 |
Types: | Journal article |
DOI: | 10.1109/TCPMT.2011.2171342 |
Bragg gratings Diode lasers Optical resonators Power generation Raman scattering Wavelength measurement emission width narrowing laser resonators micro-optics microoptical benches reflecting Bragg gratings reliability semiconductor lasers wavelength 671 nm wavelength-stabilized compact diode laser systems