About

Log in?

DTU users get better search results including licensed content and discounts on order fees.

Anyone can log in and get personalized features such as favorites, tags and feeds.

Log in as DTU user Log in as non-DTU user No thanks

DTU Findit

Conference paper · Journal article

Automated Photogrammetric Image Matching with Sift Algorithm and Delaunay Triangulation

From

Technical University of Denmark1

National Space Institute, Technical University of Denmark2

Geodesy, National Space Institute, Technical University of Denmark3

An algorithm for image matching of multi-sensor and multi-temporal satellite images is developed. The method is based on the SIFT feature detector proposed by Lowe in (Lowe, 1999). First, SIFT feature points are detected independently in two images (reference and sensed image). The features detected are invariant to image rotations, translations, scaling and also to changes in illumination, brightness and 3-dimensional viewpoint.

Afterwards, each feature of the reference image is matched with one in the sensed image if, and only if, the distance between them multiplied by a threshold is shorter than the distances between the point and all the other points in the sensed image. Then, the matched features are used to compute the parameters of the homography that transforms the coordinate system of the sensed image to the coordinate system of the reference image.

The Delaunay triangulations of each feature set for each image are computed. The isomorphism of the Delaunay triangulations is determined to guarantee the quality of the image matching. The algorithm is implemented in Matlab and tested on World-View 2, SPOT6 and TerraSAR-X image patches.

Language: English
Publisher: Copernicus Publications
Year: 2016
Pages: 23-28
Proceedings: 23rd Congress of the International Society of Photogrammetry and Remote Sensing
ISSN: 21949050 and 21949042
Types: Conference paper and Journal article
DOI: 10.5194/isprs-annals-III-2-23-2016
ORCIDs: Antón Castro, Francesc/François

DTU users get better search results including licensed content and discounts on order fees.

Log in as DTU user

Access

Analysis