Journal article
Extended x-ray absorption fine structure investigation of annealed carbon expanded austenite
Department of Physics, Technical University of Denmark1
Department of Mechanical Engineering, Technical University of Denmark2
Materials and Surface Engineering, Department of Mechanical Engineering, Technical University of Denmark3
X-ray Crystallography, Department of Chemistry, Technical University of Denmark4
Department of Chemistry, Technical University of Denmark5
Carbon expanded austenite synthesized through carburizing of austenitic stainless steel powder at 380°C was annealed at 470°C and investigated with extended X-ray absorption fine structure (EXAFS) and synchrotron powder diffraction (SPD). SPD showed that the samples consisted of carbon expanded austenite and Hägg carbide, Ξ-M5C2.
EXAFS showed that the Cr atoms were mainly present in environments similar to the carbides Hägg Ξ-M5C2 and M23C6. The environments of the Fe and Ni atoms were concluded to be largely metallic austenite. Light optical micrograph of stainless steel AISI 316 gas-carburized in a temperature regime around 470°C.
The surface zone is converted into carbon expanded austenite; the high interstitial content of carbon dissolved in the surface results in highly favorable materials properties. In the present article the local atomic environment of (annealed) carbon expanded austenite was investigated with EXAFS. Copyright © 2012 Wiley-VCH Verlag GmbH & Co.
KGaA, Weinheim.
Language: | English |
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Year: | 2012 |
Pages: | 162-168 |
ISSN: | 1869344x and 16113683 |
Types: | Journal article |
DOI: | 10.1002/srin.201100197 |
ORCIDs: | Oddershede, Jette , Christiansen, Thomas L. , Somers, Marcel A. J. and Ståhl, Kenny |
AISI 316 Absorption spectra Annealing Atomic environment Atoms Austenite Austenitic stainless steel Carbides Carbon Carburizing Chromium Cr atoms Diffraction EXAFS Expanded austenite Extended X ray absorption fine structure spectroscopy Extended X-ray absorption fine structure Hägg carbide Materials properties Ni atoms Optical micrographs Surface zones Synchrotron powder diffraction Temperature regimes X rays