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Conference paper

1/f Noise Characterization in CMOS Transistors in 0.13um Technology

In Proceedings of the 24st Norchip Conference — 2006, pp. 81-84
From

Electronics & Signal Processing, Department of Electrical Engineering, Technical University of Denmark1

Department of Electrical Engineering, Technical University of Denmark2

Centre for Physical Electronics, Centers, Technical University of Denmark3

Language: English
Year: 2006
Pages: 81-84
Proceedings: 2006 IEEE 24th NORCHIP Conference
Types: Conference paper

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Analysis