About

Log in?

DTU users get better search results including licensed content and discounts on order fees.

Anyone can log in and get personalized features such as favorites, tags and feeds.

Log in as DTU user Log in as non-DTU user No thanks

DTU Findit

Conference paper

Enhancement of Electroluminescence images for fault detection in photovoltaic panels

In Proceedings of 2018 Ieee 7th World Conference on Photovoltaic Energy Conversion — 2018, pp. 0447-0452
From

Aalborg University1

Department of Photonics Engineering, Technical University of Denmark2

Coding and Visual Communication, Department of Photonics Engineering, Technical University of Denmark3

Photovoltaic Materials and Systems, Department of Photonics Engineering, Technical University of Denmark4

Good quality images are necessary for electroluminescence (EL) image analysis and failure quantification in solar panels. In this work, a method for determining image quality in terms of more accurate failure detection in PV panels through EL imaging is proposed. The goal of the paper is to highlight the different methods for image quality improvement and to determine if the enhanced image provides more useful diagnostic information for accurate micro cracks and fracture detection.

From the work carried out in this paper, it is to be noted that averaging technique helps in improving the SNR value. Additionally, subtracting the background from the obtained averaged EL image proves to be an enhancing method for cell fracture identification and more number of edges are also detected which can be useful for micro crack quantification.

Language: English
Publisher: IEEE
Year: 2018
Pages: 0447-0452
Proceedings: 7th World Conference on Photovoltaic Energy Conversion
ISBN: 1538685299 , 1538685302 , 9781538685297 and 9781538685303
Types: Conference paper
DOI: 10.1109/PVSC.2018.8547442
ORCIDs: Mantel, Claire , Forchhammer, Søren , dos Reis Benatto, Gisele A. , Riedel, Nicholas and Poulsen, Peter Behrensdorff

DTU users get better search results including licensed content and discounts on order fees.

Log in as DTU user

Access

Analysis