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Conference paper

Mechanisms of electrochemical migration of tin by in-situ optical and electron microscopy

In Eurocorr 2010 — 2010

By Minzari, Daniel^1,2; Jellesen, Morten Stendahl^1,2; Møller, Per^1,2; Grumsen, Flemming Bjerg^1,2; Mølhave, Kristian³; Jensen, Eric³; Ambat, Rajan^1,2

From

Department of Mechanical Engineering, Technical University of Denmark¹

Materials and Surface Engineering, Department of Mechanical Engineering, Technical University of Denmark²

Department of Micro- and Nanotechnology, Technical University of Denmark³

Abstract

Language:	English
Year:	2010
Proceedings:	EUROCORR 2010
Types:	Conference paper
ORCIDs:	Jellesen, Morten Stendahl , Grumsen, Flemming Bjerg , Mølhave, Kristian and Ambat, Rajan

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Mechanisms of electrochemical migration of tin by in-situ optical and electron microscopy

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