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Conference paper

Machine Learning Prediction of Defect Types for Electroluminescence Images of Photovoltaic Panels

In Proceedings of Spie 2019, Volume 11139, pp. 1113904-1113904-9
From

Coding and Visual Communication, Department of Photonics Engineering, Technical University of Denmark1

Department of Photonics Engineering, Technical University of Denmark2

Photovoltaic Materials and Systems, Department of Photonics Engineering, Technical University of Denmark3

Aalborg University4

Photovoltaik-Institut Berlin AG5

Despite recent technological advances for Photovoltaic panels maintenance (Electroluminescence imaging, drone inspection), only few large-scale studies achieve identification of the precise category of defects or faults. In this work, Electroluminescence imaged modules are automatically split into cells using projections on the x and y axes to detect cell boundaries.

Regions containing potential defects or faults are then detected using Hough transform combined with mathematical morphology. Care is taken to remove most of the bus bars or cell boundaries. Afterwards, 25 features are computed, focusing on both the geometry of the regions (e.g. area, perimeter, circularity) and the statistical characteristics of their pixel values (e.g. median, standard deviation, skewness).

Finally, features are mapped to the ground truth labels with Support Vector Machine (RBF kernel) and Random Forest algorithms, coupled with undersampling and SMOTE oversampling, with a stratified 5- folds approach for cross validation. A dataset of 982 Electroluminescence images of installed multi-crystalline photovoltaic modules was acquired in outdoor conditions (evening) with a CMOS sensor.

After automatic blur detection, 753 images or 47244 cells remain to evaluate faults. All images were evaluated by experts in PV fault detection that labelled: Finger failures, and three types of cracks based on their respective severity levels (A, B and C). Our results based on 6 data series, yield using Support Vector Machine an accuracy of 0.997 and a recall of 0.274.

Improving the region detection process will most likely allow improving the performance.

Language: English
Publisher: SPIE - International Society for Optical Engineering
Year: 2019
Pages: 1113904-1113904-9
Proceedings: 14th International Conference on Solid State Lighting and LED-based Illumination Systems<br/>
Series: Proceedings of Spie - the International Society for Optical Engineering
ISBN: 1510629718 , 1510629726 , 9781510629714 and 9781510629721
ISSN: 1996756x and 0277786x
Types: Conference paper
DOI: 10.1117/12.2528440
ORCIDs: Mantel, Claire , Benatto, Gisele Alves dos Reis , Poulsen, Peter Behrensdorff and Forchhammer, Søren

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