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Conference paper

A Monte Carlo simulation of scattering reduction in spectral x-ray computed tomography

In Proceedings of Spie 2017, Volume 10388, pp. 103880P-103880P-9
From

Department of Physics, Technical University of Denmark1

Neutrons and X-rays for Materials Physics, Department of Physics, Technical University of Denmark2

National Space Institute, Technical University of Denmark3

Department of Applied Mathematics and Computer Science, Technical University of Denmark4

Visual Computing, Department of Applied Mathematics and Computer Science, Technical University of Denmark5

Niels Bohr Institute6

In X-ray computed tomography (CT), scattered radiation plays an important role in the accurate reconstruction of the inspected object, leading to a loss of contrast between the different materials in the reconstruction volume and cupping artifacts in the images. We present a Monte Carlo simulation tool for spectral X-ray CT to predict the scattered radiation generated by complex samples.

An experimental setup is presented to isolate the energy distribution of scattered radiation. Spectral CT is a novel technique implementing photon-counting detectors able to discriminate the energy of incoming photons, enabling spectral analysis of X-ray images. This technique is useful to extract efficiently more information on energy dependent quantities (e.g. mass attenuations coefficients) and study matter interactions (e.g.

X-ray scattering, photoelectric absorption, etc...). Having a good knowledge of the spectral distribution of the scattered X-rays is fundamental to establish methods attempting to correct for it. The simulations are validated by real measurements using a CdTe spectral resolving detector (Multix ME-100).

We observed the effect of the scattered radiation on the image reconstruction, becoming relevant in the energy range where the Compton events are dominant (i.e. above 50keV).

Language: English
Publisher: SPIE - International Society for Optical Engineering
Year: 2017
Pages: 103880P-103880P-9
Proceedings: SPIE Optics + Photonics 2017
Series: Proceedings of Spie - the International Society for Optical Engineering
ISBN: 1510612335 , 1510612343 , 9781510612334 and 9781510612341
ISSN: 1996756x and 0277786x
Types: Conference paper
DOI: 10.1117/12.2273763
ORCIDs: Busi, Matteo , Olsen, Ulrik Lund , Bergbäck Knudsen, Erik , Frisvad, Jeppe Revall , Khalil, Mohamad and Haldrup, Kristoffer

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