About

Log in?

DTU users get better search results including licensed content and discounts on order fees.

Anyone can log in and get personalized features such as favorites, tags and feeds.

Log in as DTU user Log in as non-DTU user No thanks

DTU Findit

Conference paper

Benchmarking state-of-the-art optical simulation methods for analyzing large nanophotonic structures

In Proceedings of Xxvi International Workshop on Optical Wave & Waveguide Theory and Numerical Modelling — 2018, pp. 9-9
From

Department of Photonics Engineering, Technical University of Denmark1

Zuse Institute Berlin2

Quantum and Laser Photonics, Department of Photonics Engineering, Technical University of Denmark3

Nanophotonic Devices, Department of Photonics Engineering, Technical University of Denmark4

Department of Electrical Engineering, Technical University of Denmark5

Electromagnetic Systems, Department of Electrical Engineering, Technical University of Denmark6

Department of Mechanical Engineering, Technical University of Denmark7

Solid Mechanics, Department of Mechanical Engineering, Technical University of Denmark8

St. Petersburg National Research University of Information Technologies, Mechanics and Optics (ITMO)9

Metamaterials, Department of Photonics Engineering, Technical University of Denmark10

...and 0 more

Five computational methods are benchmarked by computing quality factors and resonance wavelengths inphotonic crystal membrane L5 and L9 line defect cavities. Careful convergence studies reveal that some methods are more suitable than others for analyzing these cavities.

Language: English
Publisher: TU Dortmund University
Year: 2018
Pages: 9-9
Proceedings: 26th International Workshop on Optical Wave & Waveguide Theory and Numerical Modelling
ISBN: 3921823986 and 9783921823989
Types: Conference paper
ORCIDs: Gregersen, Niels , Frandsen, Lars Hagedorn , Kim, Oleksiy S. , Breinbjerg, Olav , Wang, Fengwen , Sigmund, Ole , Lavrinenko, Andrei and Mørk, Jesper

DTU users get better search results including licensed content and discounts on order fees.

Log in as DTU user

Access

Analysis