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Conference paper

McXtrace - An X-ray Monte Carlo Ray-tracing software package

In Programme, Abstracts and Posters — 2009, pp. 328-329

By Mortensen, Kell1; Kynde, Søren1; Knudsen, Erik1; Willendrup, Peter Kjær2,3,4; Schmidt, Søren3,4,5; Lefmann, Kim1

From

University of Copenhagen1

Nano-Microstructures in Materials, Materials Research Division, Risø National Laboratory for Sustainable Energy, Technical University of Denmark2

Materials Research Division, Risø National Laboratory for Sustainable Energy, Technical University of Denmark3

Risø National Laboratory for Sustainable Energy, Technical University of Denmark4

Metal Structures in Four Dimensions, Materials Research Division, Risø National Laboratory for Sustainable Energy, Technical University of Denmark5

Language: English
Publisher: SAS-2009 Organising Committee
Year: 2009
Pages: 328-329
Proceedings: XIV International Conference on Small-Angle Scattering
Types: Conference paper
ORCIDs: Schmidt, Søren
Keywords

Materialeforskning Materialekarakterisering og materialemodellering Materials characterization and modelling Materials research

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